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1995
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VLSID 1995
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An efficient automatic test generation system for path delay faults in combinational circuits
14 years 1 days ago
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eprints.iisc.ernet.in
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi
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Added
26 Aug 2010
Updated
26 Aug 2010
Type
Conference
Year
1995
Where
VLSID
Authors
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vishwani D. Agrawal
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VLSI Study Group
Computer Vision