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    ACM
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    Best ways to use billions of devices on a chip - Error predictive, defect tolerant and error recovery designs

    14 years 1 months ago
    Best ways to use billions of devices on a chip - Error predictive, defect tolerant and error recovery designs
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    Kazutoshi Kobayashi, Hidetoshi Onodera
    claim paper
    Added 12 Oct 2010
    Updated 12 Oct 2010
    Type Conference
    Year 2008
    Where ASPDAC
    Authors Kazutoshi Kobayashi, Hidetoshi Onodera
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