Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall verification effort on large designs, and the problem is growing worse. We introduce a new paradigm for using formal analysis, augmented with some on-chip hardware support, to automatically compute error traces that lead to an observed buggy state, thereby greatly simplifying the post-silicon debug problem. Our preliminary simulation experiments demonstrate the potential of our approach: we can "backspace" hundreds of cycles from randomly selected states of some sample designs. Our preliminary architectural studies propose some possible implementations and show that the on-chip overhead can be reasonable. We conclude by surveying future research directions.
Flavio M. de Paula, Marcel Gort, Alan J. Hu, Steve