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    Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen

    14 years 28 days ago
    Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen
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    Peter Reiser, Heyno Garbe, Dietmar Giselbrecht
    claim paper
    Added 30 Oct 2010
    Updated 30 Oct 2010
    Type Conference
    Year 2006
    Where EMV
    Authors Peter Reiser, Heyno Garbe, Dietmar Giselbrecht
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