Some Implications of MSC, SDL and TTCN Time Extensions for Computer-Aided Test Generation

The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already available or currently under study in the EC Interval project. The implications for currently available test generation tools are shown and proposals for their improvement are made. The transformation of MSC-2000 time concepts into TTCN-3 code is described in detail.

• Type: Conference
• Year: 2001
• Where: SDL
• Authors: Dieter Hogrefe, Beat Koch, Helmut Neukirchen
• Keywords: Available Test Generation, Computer-aided Test Generation, SDL 2001, SDL 2007, Test Generation