Out-of-Plane Cmos Compatible Magnetometers

Three-dimensional MEMS magnetometers with use of residual stresses in thin multilayers cantilevers are presented. Half-loop cantilevers based on Lorentz-force deflection convert magnetic flux in V changes, thanks to piezoresistive transducers mounted in Wheatstone bridge. Magnetic field in the order of 10 Gauss was measured with a sensitivity of 0.015 mV/Gauss. A Finite Element Model of the device has been developed with Ansys for static and dynamic simulations. Novel out-ofplane ferromagnetic nickel plate magnetometer is also presented.

• Type: Journal
• Year: 2008
• Where: CORR
• Authors: M. El Ghorba, Nicolas André, S. Sobieski, J. P. Raskin
• Keywords: CORR 2008, Education, Ferromagnetic Nickel Plate, Multilayers Cantilevers, Three-dimensional MEMS Magnetometers