A Fault Analytic Method against HB+

The search for lightweight authentication protocols suitable for low-cost RFID tags constitutes an active and challenging research area. In this context, a family of protocols based on the LPN problem has been proposed: the so-called HB-family. Despite the rich literature regarding the cryptanalysis of these protocols, there are no published results about the impact of fault analysis over them. The purpose of this paper is to fill this gap by presenting a fault analytic method against a prominent member of the HB-family: HB+ protocol. We demonstrate that the fault analysis model can lead to a flexible and effective attack against HB-like protocols, posing a serious threat over them.

• Type: Journal
• Year: 2010
• Where: CORR
• Authors: Jose Carrijo, Rafael Tonicelli, Anderson C. A. Nascimento
• Keywords: Challenging Research Area, CORR 2010, Education, Lightweight Authentication Protocols, Low-cost Rfid Tags