Statistical Classification of Raw Textile Defects

In this paper, the problem of classification of defects occurring in a textile manufacture is addressed. A new classification scheme is devised in which different features, extracted from the gray level histogram, the shape, and cooccurrence matrices, are employed. These features are classified using a Support Vector Machines (SVM) based framework, and an accurate analysis of different multiclass classification schemes and SVM parameters has been carried out. The system has been tested using two textile databases showing very promising results.

• Type: Conference
• Year: 2004
• Where: ICPR
• Authors: Ivan A. Rossi, Manuele Bicego, Vittorio Murino
• Keywords: Computer Vision, Gray Level Histogram, ICPR 2004, Support Vector Machines, SVM Parameters