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2008

Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique

14 years 16 days ago
Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique
Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury
Added 10 Dec 2010
Updated 10 Dec 2010
Type Journal
Year 2008
Where ET
Authors Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury, Kaushik Roy
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