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ET
2008

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Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique

13 years 11 months ago

Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique

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Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury

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Added	10 Dec 2010
Updated	10 Dec 2010
Type	Journal
Year	2008
Where	ET
Authors	Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury, Kaushik Roy

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