Convex Source Support and Its Application to Electric Impedance Tomography

The aim in electric impedance tomography is to recover the conductivity inside a physical body from boundary measurements of current and voltage. In many situations of practical importance, the investigated object has known background conductivity but is contaminated by inhomogeneities. In this work, we try to extract all possible information about the support of such inclusions inside a twodimensional object from only one pair of measurements of impedance tomography. Our noniterative and computationally cheap method is based on the concept of the convex source support, which stems from earlier works of Kusiak, Sylvester, and the authors. The functionality of our algorithm is demonstrated by various numerical experiments. Key words. electric impedance tomography, inverse source problems, scattering support, source support, inclusions AMS subject classifications. 35R30, 65N21 DOI. 10.1137/080715640

• Type: Journal
• Year: 2008
• Where: SIAMIS
• Authors: Martin Hanke, Nuutti Hyvönen, Stefanie Reusswig
• Keywords: Electric Impedance Tomography, Impedance Tomography, SIAMIS 2008, Source Support