Neural networks for HREM image analysis

14 years 12 days ago

We present a new neural network-based method of image processing for determining the local composition and thickness of III

Holger Kirschner, Reinald Hillebrand

ISCI 2000 | Neural Network-based Method | Resolution Electron Microscope | Semiconductor |

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Added	18 Dec 2010
Updated	18 Dec 2010
Type	Journal
Year	2000
Where	ISCI
Authors	Holger Kirschner, Reinald Hillebrand

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