Neural networks for HREM image analysis

13 years 11 months ago

We present a new neural network-based method of image processing for determining the local composition and thickness of III

Holger Kirschner, Reinald Hillebrand

ISCI 2000 | Neural Network-based Method | Resolution Electron Microscope | Semiconductor |

claim paper

Added	18 Dec 2010
Updated	18 Dec 2010
Type	Journal
Year	2000
Where	ISCI
Authors	Holger Kirschner, Reinald Hillebrand

Comments (0)