Error Detection Rate of MC/DC for a Case Study from the Automotive Domain

Chilenski and Miller [1] claim that the error detection probability of a test set with full modified condition/decision coverage (MC/DC) on the system under test converges to 100% for an increasing number of test cases, but there are also examples where the error detection probability of an MC/DC adequate test set is indeed zero. In this work we analyze the effective error detection rate of a test set that achieves maximum possible MC/DC on the code for a case study from the automotive domain. First we generate the test cases automatically with a model checker. Then we mutate the original program to generate three different error scenarios: the first error scenario focuses on errors in the value domain, the second error scenario focuses on errors in the domain of the variable names and the third error scenario focuses on errors within the operators of the boolean expressions in the decisions of the case study. Applying the test set to these mutated program versions shows that all err...

• Type: Journal
• Year: 2010
• Where: SEUS
• Authors: Susanne Kandl, Raimund Kirner
• Keywords: Embedded Systems, Error Detection, Error Detection Rate, Error Scenario, SEUS 2010