HI-C: diagnosing object churn in framework-based applications

In prior work we have developed an escape analysis to help developers identify sources of object churn (i.e., excessive use of temporaries) in large framework-based applications. We have developed HI-C, an Eclipse plug-in that allows users to visualize, filter, and explore analysis results to aid them in diagnosis of object churn and in program comprehension in general. Categories and Subject Descriptors D.2.5 [Software Engineering]: Testing and Debugging--Diagnostics General Terms Measurement, Performance

• Type: Journal
• Year: 2010
• Where: SIGSOFT
• Authors: Marc Fisher II, Luke Marrs, Barbara G. Ryder
• Keywords: Escape Analysis, General Terms Measurement, Large Framework-based Applications, SIGSOFT 2010, Software Engineering