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    EMISAIJ
    2011
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    Detecting Common Errors in Event-Driven Process Chains by Label Analysis

    13 years 6 months ago
    Detecting Common Errors in Event-Driven Process Chains by Label Analysis
    Download  ebus.informatik.uni-leipzig.de
    Volker Gruhn, Ralf Laue
    claim paper
    Added 14 May 2011
    Updated 14 May 2011
    Type Journal
    Year 2011
    Where EMISAIJ
    Authors Volker Gruhn, Ralf Laue
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