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CORR
2010
Springer

Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter

13 years 6 months ago
Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter
Nitin Saxena, C. Seshadhri
Added 14 May 2011
Updated 14 May 2011
Type Journal
Year 2010
Where CORR
Authors Nitin Saxena, C. Seshadhri
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