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JISE
2011

SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories

13 years 5 months ago
SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories
Tsu-Wei Tseng, Jin-Fu Li
Added 14 May 2011
Updated 14 May 2011
Type Journal
Year 2011
Where JISE
Authors Tsu-Wei Tseng, Jin-Fu Li
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