JISE
2011
SETBIST: An Soft-Error Tolerant Built-In Self-Test Scheme for Random Access Memories
13 years 5 months ago
Tsu-Wei Tseng, Jin-Fu Li
Added |
14 May 2011 |
Updated |
14 May 2011 |
Type |
Journal |
Year |
2011 |
Where |
JISE |
Authors |
Tsu-Wei Tseng, Jin-Fu Li |
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