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ICSE
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Software Engineering
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The effect of program and model structure on mc/dc test adequacy coverage
14 years 11 months ago
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Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei
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Added
17 Nov 2009
Updated
17 Nov 2009
Type
Conference
Year
2008
Where
ICSE
Authors
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl
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