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20

STOC
2010
ACM

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Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in

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Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in

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Zohar S. Karnin and Partha Mukhopadhyay and Amir S

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Algorithms | Deterministic Identity Testing | STOC 2010 |

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Added	01 Mar 2010
Updated	02 Mar 2010
Type	Conference
Year	2010
Where	STOC
Authors	Zohar S. Karnin and Partha Mukhopadhyay and Amir Shpilka and Ilya Volk

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