Compressed Embedded Diagnosis of Logic Cores

This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on onchip decompression and comparison of incompletely specified test patterns and test responses. Using experimental data, the trade-offs between the number of tester channels, on-chip area and scan time are discussed.

• Type: Conference
• Year: 2004
• Where: ICCD
• Authors: Scott Ollivierre, Adam B. Kinsman, Nicola Nicolici
• Keywords: Hardware, ICCD 2004, On-chip Area, Test Patterns, Test Responses