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    ICCAD
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    IEEE
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    Design and CAD challenges in 45nm CMOS and beyond

    14 years 9 months ago
    Design and CAD challenges in 45nm CMOS and beyond
    Download  www.cecs.uci.edu
    With semiconductor industry's aggressive march towards 45nm
    David J. Frank, Ruchir Puri, Dorel Toma
    claim paper
    Added 16 Mar 2010
    Updated 16 Mar 2010
    Type Conference
    Year 2006
    Where ICCAD
    Authors David J. Frank, Ruchir Puri, Dorel Toma
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