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20

ECCV
2004
Springer

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151views Computer Vision» more ECCV 2004»

The Isophotic Metric and Its Application to Feature Sensitive Morphology on Surfaces

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The Isophotic Metric and Its Application to Feature Sensitive Morphology on Surfaces

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Helmut Pottmann, Tibor Steiner, Michael Hofer, Chr

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Computer Vision | ECCV 2004 | Sensitive Morphology |

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Added	15 Oct 2009
Updated	15 Oct 2009
Type	Conference
Year	2004
Where	ECCV
Authors	Helmut Pottmann, Tibor Steiner, Michael Hofer, Christoph Haider, Allan Hanbury

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