Safety Evaluation of NanoFabrics

Chemically Assembled Electronic Nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing digital circuits. The paper proposes some preliminary considerations about safety of application-oriented nanoFabrics based on some results obtained through an automated platform for fault simulation. In particular, a single-fault detecting methodology is proposed and evaluated. Different fault models have been taken into account in order to evaluate alternative scenarios.

• Type: Conference
• Year: 2007
• Where: DFT
• Authors: Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
• Keywords: DFT 2007, Fault Simulation, Hardware, Promising Alternative, Single-fault Detecting Methodology