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DSN
2007
IEEE

Enhanced Reliability Modeling of RAID Storage Systems

14 years 5 months ago
Enhanced Reliability Modeling of RAID Storage Systems
A flexible model for estimating reliability of RAID storage systems is presented. This model corrects errors associated with the common assumption that system times to failure follow a homogeneous Poisson process. Separate generalized failure distributions are used to model catastrophic failures and usage dependent data corruptions for each hard drive. Catastrophic failure restoration is represented by a three-parameter Weibull, so the model can include a minimum time to restore as a function of data transfer rate and hard drive storage capacity. Data can be scrubbed as a background operation to eliminate corrupted data that, in the event of a simultaneous catastrophic failure, results in double disk failures. Field-based times to failure data and mathematic justification for a new model are presented. Model results have been verified and predict between 2 to 1,500 times as many double disk failures as that estimated using the current mean time to data loss method.
Jon G. Elerath, Michael Pecht
Added 02 Jun 2010
Updated 02 Jun 2010
Type Conference
Year 2007
Where DSN
Authors Jon G. Elerath, Michael Pecht
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