Radiation Hardened Coarse-Grain Reconfigurable Architecture for Space Applications

Technology trends are such that single event effects (SEE)are likely to become even more of a concern for the future. Decreasing feature sizes, lower operating voltage, and higher speeds, all conspire to increase susceptibility to single event upsets (SEU). Upset in avionics is an established concern. Upset at the ground level is becoming a concern for manufacturers of microelectronics for terrestrial applications. The use of flipchip packaging and multiple levels of metals further exacerbate the problem. Typical methods of mitigation that either increase the transistor count or reduce IC performance are not acceptable to commercial manufacturers. SOI technology may help in this regard, but is not a magic bullet to end all SEE concerns. We present unique schemes to model and rectify single event disruption in combinatorial and synchronous parts of a reconfigurable architecture. We compare our scheme with different schemes already introduced and results are reported to prove the effica...

• Type: Conference
• Year: 2007
• Where: IPPS
• Authors: Sajid Baloch, Tughrul Arslan, Adrian Stoica
• Keywords: Distributed And Parallel Computing, IPPS 2007, Single Event, Single Event Effects, Single Event Upsets