172
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
170
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
It has been widely recognized that the dynamic range information of an application can be exploited to reduce the datapath bitwidth of either processors or ASICs, and therefore th...
185
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Bounded Model Checking (BMC) relies on solving a sequence of highly correlated Boolean satisfiability (SAT) problems, each of which corresponds to the existence of counter-example...
152
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Reconfigurable Systems-on-Chip (SoCs) on the market consist of full-fledged processors and large Field-Programmable Gate-Arrays (FPGAs). The latter can be used to implement the sy...
136
click to vote
DAC
2004
ACM
16 years 7 months ago
2004
ACM
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
142
click to vote
DAC
2004
ACM
16 years 7 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...