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    IEEE
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    Addressable test ports an approach to testing embedded cores

    14 years 3 months ago
    Addressable test ports an approach to testing embedded cores
    Download  etdncku.lib.ncku.edu.tw
    Lee Whetsel
    claim paper
    Added 04 Aug 2010
    Updated 04 Aug 2010
    Type Conference
    Year 1999
    Where ITC
    Authors Lee Whetsel
    Comments (0)
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