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ITC
1999
IEEE
105views Hardware» more  ITC 1999»
13 years 11 months ago
Finite state machine synthesis with concurrent error detection
A new synthesis technique for designing finite state machines with on-line parity checking is presented. The output logic and the next-state logic of the finite state machines are...
Chaohuang Zeng, Nirmal R. Saxena, Edward J. McClus...
ITC
1999
IEEE
66views Hardware» more  ITC 1999»
13 years 11 months ago
Robust testability of primitive faults using test points
Ramesh C. Tekumalla, Premachandran R. Menon
ITC
1999
IEEE
103views Hardware» more  ITC 1999»
13 years 11 months ago
Resistive bridge fault modeling, simulation and test generation
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
Vijay R. Sar-Dessai, D. M. H. Walker
ITC
1999
IEEE
66views Hardware» more  ITC 1999»
13 years 11 months ago
High-level ATPG for Early Power Analysis
Wolfgang Roethig
ITC
1999
IEEE
67views Hardware» more  ITC 1999»
13 years 11 months ago
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
SEMATECH has sponsored a "Test Method Evaluation" study to understand the trade-offs among the most common test methodologies used in the industry[1,2]. This paper prese...
Phil Nigh, David P. Vallett, Atul Patel, Jason Wri...
ITC
1999
IEEE
98views Hardware» more  ITC 1999»
13 years 11 months ago
A design diversity metric and reliability analysis for redundant systems
Design diversity has long been used to protect redundant systems against common-mode failures. The conventional notion of diversity relies on "independent" generation of...
Subhasish Mitra, Nirmal R. Saxena, Edward J. McClu...
ITC
1999
IEEE
107views Hardware» more  ITC 1999»
13 years 11 months ago
A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming
A high-level built-in self-test (BIST) synthesis involves several tasks such as system register assignment, interconnection assignment, and BIST register assignment. Existing high...
Han Bin Kim, Dong Sam Ha