Analog Circuit Sizing Using Adaptive Worst-Case Parameter Sets

In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These sets are calculated adaptively during the sizing process based on sensitivity analyses. The method leads to robust designs with high parametric yield, while being much more efficient than design centering methods.

• Type: Conference
• Year: 2002
• Where: DATE
• Authors: Robert Schwencker, Frank Schenkel, Michael Pronath, Helmut E. Graeb
• Keywords: Analog Integrated Circuits, DATE 2002, Design Centering Methods, Hardware, Worst-case Parameter Sets