BiTeS: a BDD based test pattern generator for strong robust path delay faults

This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are hazard free. The algorithm uses Binary Decision Diagrams (BDDs) for the computation and representation of the test sets. It has been implemented as the program BiTeS. The implementation is very simple, since only BDD operations must be carried out. BiTeS computes the complete set of patterns that lead to a test instead of a single test. Thus, methods for test set compaction can easily be applied. Experimental results are presented to demonstrate the eciency of BiTeS.

• Type: Conference
• Year: 1994
• Where: EURODAC
• Authors: Rolf Drechsler
• Keywords: EURODAC 1994, Path Delay Faults, Test Set, Test Set Compaction, VHDL