CHARDIN: An Off-Chip Transient Current Monitor with Digital Interface for Production Testing

We present a measurement module that computes the charge from the transient supply current and provides a digital value of this magnitude. The module is constructed to provide a feasible implementation of transient current testing in production-like environments. Experimental results demonstrate up to 1 GHz analog bandwidth, while the effective test speed is mainly determined by the A/D converter included in the module.

• Type: Conference
• Year: 2003
• Where: ITC
• Authors: Bartomeu Alorda, B. Bloechel, Ali Keshavarzi, Jaume Segura
• Keywords: GHz Analog Bandwidth, Hardware, ITC 2003, Measurement Module, Transient Current Testing