In this paper we present an overview of an on-chip noise detection circuit. Mainly, this work is different form the previous works concerning on-chip noise measurement in one or more of the following: First: it does not assume specific noise properties such as periodicity. Second: the requested bandwidth of the output channel can be adjusted freely, therefore, the user can avoid the effect of on-chip parasites and the need to offchip sophisticated monitoring tools. Third: the detector is equipped with an on-chip voltage divider, which enables measuring the high and low swing fluctuations accurately. Therefore, the detector is suitable to measure the nonperiodic /single event noise for the purpose of reliability evaluation and performance modeling. A slower version of the detector is implemented in a test chip using Hitachi 0.18µm technology.