On-Chip Multi-Channel Waveform Monitoring for Diagnostics of Mixed-Signal VLSI Circuits

Multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sample time generation with a 10-bit variable step delay generator and algorithmic digitization with a 10-bit incremental reference voltage generator. The prototype in a 0.18-µm CMOS technology demonstrated on-chip waveform acquisition at 40-ps and 200-µV resolutions. The waveforms were as accurate as those by an off-chip measurement technique, while more than 95 % reduction of the waste time in waveform monitoring was achieved. The area of 700µm × 600µm was occupied by a single waveform acquisition kernel that was shared with 8 front-end modules of 60µm × 200µm each. The developed on-chip multi-channel waveform monitoring technique is waveform accurate, area efficient, and low cost, which are all requisite factors for diagnosing methodology toward mixed analog and digital signal integrity in a systems-...

• Type: Conference
• Year: 2005
• Where: DATE
• Authors: Koichiro Noguchi, Makoto Nagata
• Keywords: DATE 2005, Hardware, Waveform, Waveform Monitoring, Waveform Monitoring Technique