CMOS Built-In Test Architecture for High-Speed Jitter Measurement

A BIST method measures accumulated jitter over N periods and requires no external references. Simulation using a 0.25um process shows a 625MHz - 1GHz input range with resolution of 70ps RMS jitter occupying 0.0575mm2 area.

• Type: Conference
• Year: 2003
• Where: ITC
• Authors: Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz
• Keywords: 70ps Rms, External References, Hardware, ITC 2003, Measures Accumulated Jitter