Cold Delay Defect Screening

Delay defects can escape detection during the normal production test flow, particularly if they do not affect any of the long paths included in the test flow. Some defect types can have their delay increased, making them easier to detect, by carrying out the test with a very low supply voltage (VLV testing). However, VLV testing is not effective for some delay defects such as high resistance interconnnects. This paper presents a screening technique for such defects. This technique relies on carrying out the test at low temperature. One particular type of defect, salicide resistive opens, is analyzed and experimental data is presented to demonstrate the effectiveness of cold testing.

• Type: Conference
• Year: 2000
• Where: VTS
• Authors: Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu
• Keywords: Delay Defects, Hardware, Test Flow, VLV Testing, VTS 2000