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VTS
2000
IEEE
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VTS 2000
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Cold Delay Defect Screening
14 years 28 days ago
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www-crc.stanford.edu
Delay defects can escape detection during the normal production test flow, particularly if they do not affect any of the long paths included in the test flow. Some defect types ca...
Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao...
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