Compact structural test generation for analog macros

A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design. Parameters of so-called test configurations are optimized for detection of faults in a fault-list and an optimal selection algorithm results in determining the best test set. The distribution of the results along the parameter-axes of the test configurations is investigated to identify a collapsed high-quality test set.

• Type: Conference
• Year: 1997
• Where: DATE
• Authors: V. Kaal, Hans G. Kerkhoff
• Keywords: DATE 1997, Fault-model Based Methodology, Hardware, So-called Test Configurations, Test Configurations