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ATS
2003
IEEE
2003
IEEE
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders
Real-time Traffic| Added | 04 Jul 2010 |
| Updated | 04 Jul 2010 |
| Type | Conference |
| Year | 2003 |
| Where | ATS |
| Authors | Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri |
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