ATS 2003 - PDF Preprint Papers

ATS 2003 Asian Test Symposium

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ATS
2003
IEEE

151views Hardware» more ATS 2003»

BDD Based Synthesis of Symmetric Functions with Full Path-Delay Fault Testability

14 years 4 months ago

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A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. We apply BDDs for the synthesis of sy...

Junhao Shi, Görschwin Fey, Rolf Drechsler

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Id	Views	Title	Status

1	151	BDD Based Synthesis of Symmetric Functions with Full Path-Delay Fault Testability	claim
2	131	Software-Based Delay Fault Testing of Processor Cores	claim
3	126	Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces	claim
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5	110	Chip-Level Diagnostic Strategy for Full-Scan Designs with Multiple Faults	claim
6	106	Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders	claim
7	105	Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method	claim
8	100	A Processor-Based Built-In Self-Repair Design for Embedded Memories	claim
9	98	Automatic Design Validation Framework for HDL Descriptions via RTL ATPG	claim
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11	91	An On-Chip Jitter Measurement Circuit for the PLL	claim
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13	84	Test Time Minimization for Hybrid BIST of Core-Based Systems	claim
14	76	STAGE: A Decoding Engine Suitable for Multi-Compressed Test Data	claim
15	75	An Enhanced Test Generator for Capacitance Induced Crosstalk Delay Faults	claim

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