Concurrent Test Generation

We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or most) faults in the set. When concurrent tests are generated for fault sets obtained from independence fault collapsing, minimal or near-minimal tests can be expected. This paper gives new simulation-based methods for independence fault collapsing and for deriving concurrent tests using single-fault ATPG.

• Type: Conference
• Year: 2005
• Where: ATS
• Authors: Vishwani D. Agrawal, Alok S. Doshi
• Keywords: ATS 2005, Concurrent Tests, Hardware, Independence Fault, Target Faults