ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
The need for high-performance pipelined architectures has resulted in the adoption of latch based designs with multiple, interacting clocks. For such designs, time sharing across ...
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, we present a methodology that uses the moments of a generic crosstalk pulse signal to derive upper bounds on the amplitude of crosstalk pulse in arbitrary interconn...
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, we develop a method to analyze the probability of access failure in SRAM array (due to random Vt variation in transistors) by jointly considering variations in cell...
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...