Condenser-Based Instant Reflectometry

We present a technique for rapid capture of high quality bidirectional reflection distribution functions(BRDFs) of surface points. Our method represents the BRDF at each point by a generalized microfacet model with tabulated normal distribution function (NDF) and assumes that the BRDF is symmetrical. A compact and light-weight reflectometry apparatus is developed for capturing reflectance data from each surface point within one second. The device consists of a pair of condenser lenses, a video camera, and six LED light sources. During capture, the reflected rays from a surface point lit by a LED lighting are refracted by a condenser lenses and efficiently collected by the camera CCD. Taking advantage of BRDF symmetry, our reflectometry apparatus provides an efficient optical design to improve the measurement quality. We also propose a model fitting algorithm for reconstructing the generalized microfacet model from the sparse BRDF slices captured from a material surface point. Our new ...

• Type: Journal
• Year: 2010
• Where: CGF
• Authors: Yanxiang Lan, Yue Dong, Jiaping Wang, Xin Tong, Baining Guo
• Keywords: CGF 2008, CGF 2010, Condenser Lenses, Generalized Microfacet Model, Surface Point