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    TODAES
    1998
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    Confidence analysis for defect-level estimation of VLSI random testing

    14 years 3 days ago
    Confidence analysis for defect-level estimation of VLSI random testing
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    Wen-Ben Jone, K. S. Tsai
    claim paper
    Added 23 Dec 2010
    Updated 23 Dec 2010
    Type Journal
    Year 1998
    Where TODAES
    Authors Wen-Ben Jone, K. S. Tsai
    Comments (0)
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