3 search results - page 1 / 1 » Confidence analysis for defect-level estimation of VLSI rand... |
TODAES
1998
13 years 7 months ago
1998
CSDA
2006
13 years 7 months ago
2006
The mixture of Type-I and Type-II censoring schemes, called the hybrid censoring scheme is quite common in life-testing or reliability experiments. Recently Type-II progressive ce...
DFT
2007
IEEE
14 years 2 months ago
2007
IEEE
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...