Current Testing for Nanotechnologies: A Demystifying Application Perspective.

: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not adequate to meet these challenges and illustrates that there are alternative add-on solutions available that not only can be used to overcome the challenges but meanwhile also help to improve screening efficiency, reduce test efforts, time and cost in combination with improving test and product quality. The paper also considers the application requirements imposed by advanced add-on IDDQ measurement solutions and illustrates their application and achievable benefits on base of a number of real-life case studies. At the end conclusions are drawn and guidelines for the future are presented.

• Type: Conference
• Year: 2005
• Where: ATS
• Authors: Hans A. R. Manhaeve
• Keywords: Add-on Iddq Measurement, Alternative Add-on Solutions, ATS 2005, Hardware, Measurement Solutions