A Design-for-Diagnosis Technique for SRAM Write Drivers

∗ Diagnosis is becoming a major concern with the rapid development of semiconductor memories. It provides information about the location of manufacturing defects in the memory, and its effectiveness allows a fast yield ramp up. Most of existing diagnosis methods uses a fault dictionary to provide detailed information of fault localization. However, these solutions are most of the time unable to distinguish between all faults, and more importantly often fail to identify the actual faulty block of the memory. Identifying which block of a memory (corecell array, write drivers, address decoders, pre-charge circuits, etc …) is defective allows saving considerable amount of time during the ramp up phase. In this paper, we propose a very low cost Design-forDiagnosis (DfD) solution for identifying faulty write drivers. It consists in verifying logic and analog conditions that guarantee the fault-free behavior of the write driver. The proposed solution allows a fast diagnosis (only three co...

• Type: Conference
• Year: 2008
• Where: DATE
• Authors: Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin
• Keywords: DATE 2008, Faulty Write Drivers, Hardware, Ramp Up, Write Drivers