EMISAIJ
2011
Detecting Common Errors in Event-Driven Process Chains by Label Analysis
13 years 6 months ago
Volker Gruhn, Ralf Laue
Added |
14 May 2011 |
Updated |
14 May 2011 |
Type |
Journal |
Year |
2011 |
Where |
EMISAIJ |
Authors |
Volker Gruhn, Ralf Laue |
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