Diagnosis of Realistic Defects Based on the X-Fault Model

Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling technique for complex defect mechanisms. We analyze the performance of the X-fault diagnosis for a number of defect classes leading to highly complex circuit behavior on electrical level. Experiments performed using accurate resistivebridge and interconnect-open simulators demonstrate the superiority of X-fault diagnosis over traditional methods.

• Type: Conference
• Year: 2008
• Where: DDECS
• Authors: Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen
• Keywords: Complex Defect Mechanisms, Conventional Fault Models, DDECS 2008, Hardware, State-of-the-art Fault Diagnosis