Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification

This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructed with standard cells, and thus can be easily embedded in SoCs for design verification. The performance of the gated oscillator is verified with fabricated test chips in a 90nm process.

• Type: Conference
• Year: 2008
• Where: ASPDAC
• Authors: Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye
• Keywords: ASPDAC 2008, Digital Measurement Circuit, Gated Oscillator, Hardware, Power Supply Noise