ASPDAC
2008
ACM
14 years 2 months ago
2008
ACM
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructe...
ASPDAC
2007
ACM
14 years 4 months ago
2007
ACM
Power supply noise increases the circuit delay, which may lead to performance failure of a design. Decoupling capacitance (decap) addition is effective in reducing the power suppl...
ASPDAC
2007
ACM
14 years 4 months ago
2007
ACM
Abstract-- With technology further scaling into deep submicron era, power supply noise become an important problem. Power supply noise problem is getting worse due to serious IR-dr...
ICCAD
2000
IEEE
14 years 4 months ago
2000
IEEE
In this paper, we propose an approach for the analysis of power supply noise in the frequency domain for power/ground (P/G) networks of tree topologies. We model the P/G network a...
ASPDAC
2009
ACM
14 years 5 months ago
2009
ACM
— In three-dimensional (3D) chips, the amount of supply current per package pin is significantly more than in two-dimensional (2D) designs. Therefore, the power supply noise pro...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
Power supply noise is a strong function of the switching activities of the circuit modules. Peak power supply noise can be significantly reduced by judiciously arranging the modu...
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
—As the operating frequency of digital systems increases and voltage swing decreases, it becomes very important to characterize and analyze power distribution networks (PDNs) acc...
IOLTS
2003
IEEE
14 years 5 months ago
2003
IEEE
On-chip global interconnections in very deep submicron technology (VDSM) ICs are becoming more sensitive and prone to errors caused by power supply noise, crosstalk noise, delay v...
ISPD
2005
ACM
14 years 5 months ago
2005
ACM
With increase of clock frequency, on-chip wire inductance starts to play an important role in power/ground distribution analysis, although it has not been considered so far. We pe...
VTS
2005
IEEE
14 years 5 months ago
2005
IEEE
Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise est...