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    The effect of program and model structure on mc/dc test adequacy coverage

    15 years 1 months ago
    The effect of program and model structure on mc/dc test adequacy coverage
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    Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei
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    Added 17 Nov 2009
    Updated 17 Nov 2009
    Type Conference
    Year 2008
    Where ICSE
    Authors Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl
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