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23

ICSE
2008
IEEE-ACM

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The effect of program and model structure on mc/dc test adequacy coverage

14 years 11 months ago

The effect of program and model structure on mc/dc test adequacy coverage

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Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei

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ICSE 2008 | Software Engineering |

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Added	17 Nov 2009
Updated	17 Nov 2009
Type	Conference
Year	2008
Where	ICSE
Authors	Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl

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